Publication

Materials Imaging & Integration

Presentations

Total 15건 1 페이지
  • 1Refereed Conference Proceedings

  • 15

    "Mechanism Study of Reversible Resistivity Change in Oxide Thin Film"

    S. Hong, S. H. Chang, C. Phatak, B. Magyari-Kope, Y. Nishi, S. Chattopadhyay, and J. H. Kim, ECS Transactions 69, 51 - 55, 2015

  • 14

    "Pb effects on NiO and Pb-contained solution interface with high-resolution x-ray reflectivity"

    J. J. Kim, C. Park, H. Hong, T. Kim, S. Kim, C. B. Bahn, J. D. Hoffman, A. Bhattacharya, J. H. Kim, and S. Hong, 17th International Conference on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors Proceeding (August 9-12, 2015, Ottawa, Ontario, Canada), 2015

  • 13

    "Investigation of Resistive Probes with High Sensitivity"

    S. W. Kim, J. Y. Song, J. P. Kim, W. Y. Choi, H. K. Chung, J. H. Park, H. Ko, H. Park, C. Park, S. Hong, S. H. Choa, J. D. Lee, 2008 IEEE Silicon Nanoelectronics Workshop, 167-168, 2008

  • 12

    "Ferroelectric thin films with nano-grain structure for terabit storage devices"

    S. Buehlmann, S. Hong, Y. K. Kim, Y.-W. Nam, A. Tikhonovsky, K. Kim, Y. Kim, J. Kim, Samsung Journal of Innovative Technology 3(2), 1-7, 2007

  • 11

    "Modeling and Simulation of a Resistive Thermal Probe"

    D.-K. Min, S. Hong, IEEE Sensors Conference (Atlanta, GA, Oct 28 -31, 2007), 320 - 324, 2007

  • 10

    "Analysis and modeling of resistive probes"

    S. W. Kim, W. Y. Choi, J. Y Song, J. P. Kim, J. Kim, H. Ko, H. Park, C. Park, S. Hong, S.-H. Choa, J. D. Lee, IEEE Nanotechnology Materials and Devices Conference (Gyeongju, Korea) Proceedings, 318-319, 2006

  • 9

    "A new resistive prove with higher resolution"

    J. Lee, J. Kim, J. Jung, S. Hong, B.-G. Park, IEEE Nanotechnology Materials and Devices Conference (Gyeongju, Korea) Proceedings, 114-115, 2006

  • 8

    "Design optimization of scanning resistive microscopy (SRM) probe for spatial resolution improvement"

    H. Ko, S. Hong, H. Park, C. Park, J. Jung, D.-K. Min, S. H. Choa, H. Shin, H. Lee, 2006 IEEE Sensors, Vols 1-3, 1426-1427, 2006

  • 7

    "Direct nanoscale observation of size effect on polarization instability in Pb(Zr,Ti)O3 film capacitors"

    I. Stolichnov, E. Colla, A. Tagantsev, S. Hong, N. Setter, Materials Research Society Symposium Proceedings 688, 235-240, 2002

  • 6

    "Construction of probe-based data storage with ultra-high areal density"

    H. Shin, J. U. Jeon, S. Hong, J. Choi, H. M. Jeong, D. K. Min, Y. I. Kim, C. S. Lee, S. Lee, Proceedings of the 2001 1st IEEE Conference on Nanotechnology, 207-212, 2001

  • 5

    "Selective depositions of Fe-containing oxide films on mixed self-assembled organic monolayers using microcontact printing"

    H. Shin, H. Im, S. Hong, K. Lee, G. Lim, J. U. Jeon, E. S. Kim, Y.E. Pak, Materials Research Society Symposium Proceedings 576, 95-100, 1999

  • 4

    "Characterization of retention phenomena of micron-size electrical domains in PZT thin films,"

    S. Hong, H. Shin, Y. E. Pak, K. No, Materials Research Society Symposium Proceedings 574, 95-100, 1999

  • 3

    "Formation and observation of ferroelectric domains in Pb(Zr1-x,Tix)O3 (PZT) thin films using atomic force microscopy"

    H. Shin, K. Lee, G. Lim, J. U. Jeon, Y. E. Pak, S. Hong, and K. No, SPIE Proceeding on Smart Structures and Materials 3675, 94-102, 1999

  • 2

    "Simulation study and fabrication of high-transmittance attenuated phase-shifting mask"

    E. Kim, S. Hong, S.-Y. Moon, Y. H. Kim, H. Yoon, K. No, 19th Annual Symposium on Photomask Technology, 1999

  • 1

    "Investigation on application of chromium-based materials to attenuated phase shift masks for DUV exposure"

    S. Hong, E. Kim, Z. -T. Jiang, B. -S. Bae, K. No, S. -C. Lim, S. -G. Woo, and Y. -B. Koh, Proceedings of SPIE: Photomask and X-Ray Mask Technology III 2793, 134, 1996

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