Method of Reproducing Information using Semiconductor Probe and Device adopting the Semiconductor Probe
- Code 1
- US 7,746,753 (2010)(issued)
- Code 2
- JP 4503587B2 (2010)(issued)
- Code 3
- CN 101000782B (2012)(issued)
- Code 4
- KR 0682956 (2007)(issued)
Materials Imaging & Integration