Semiconductor Probe Having Wedge Shape Resistive Tip and Method of Fabricating the Same
- Code 1
- US 7,994,499 (2011)(issued)
- Code 2
- JP 4564038B2 (2010)(issued)
- Code 3
- CN 101159171B (2013)(issued)
- Code 4
- KR 0829565 (2008)(issued)
Materials Imaging & Integration