"Screen charge transfer by grounded tip on ferroelectric surfaces"

Y. Kim*, J. Kim, S. Bühlmann, S. Hong, Y. K. Kim, S.-H. Kim and K. No, Physica Status Solidi - Rapid Research Letter, 2 (2), 74-76

"Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling"

J. H. Yoo*, J.-M. Yang, S. Ulugbek, C. W. Ahn, W.-J. Hwang, J. K. Park, C. M. Park, S. Hong, J. J. Kim, and D. Shindo, Journal of Electron Microscopy, 57 (1), 13-18

"Characterization of Sensitivity and Resolution of Silicon Resistive Probe"

J. Kim, J. Lee, I. Song, J. D. Lee, B.-G. Park, S. Hong, H. Ko, D.-K. Min, H. Park, C. Park, J. Jung, and H. Shin*, Japanese Journal of Applied Physics, 47, 1717