Materials Imaging & Integration
"Modeling and Simulation of a Resistive Thermal Probe"
D. K. Min*, S. Hong*, IEEE Sensors, 320-324
"Injection charge assisted polarization reversal in ferroelectric thin films"
Y. Kim*, S. Bühlmann, S. Hong, S.-H. Kim, and K. No, Applied Physics Letters, 90 (7), 072910
"Nano-tribological characteristics of PZT thin film investigated by atomic force microscopy"
K.-H. Chung, Y.-H. Lee, Y.-T. Kim, D.-E. Kim*, J. Yoo and S. Hong, Surface and Coatings Technology, 201 (18), 7983-7991
"Local surface potential distribution in oriented ferroelectric thin films"
Y. Kim*, S. Bühlmann, J. Kim, M. Park, K. No, Y. K. Kim, and S. Hong, Applied Physics Letters, 91 (5), 052906