"Design and Analysis of the Position Detection Algorithm for a Probe Storage"

D. K. Min*, S. Hong*, IEEE Sensors Journal, 6 (4), 1010-1015

"Ferroelectric Thin Films: Review of Materials, Properties and Applications"

N. Setter*, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, H. Kohlstedt, A. Kingon, N. Y. Park, G. B. Stephenson, I. Stolitchnov, A. K. Tagantsev, D. V. Taylor, T. Yamada, S. Streiffer, Journal of Applied Physics, 100 (5), 051606

"Correlation between grain size and domain size distribution in ferroelectric media for probe storage applications"

Y. Kim*, Y. Cho, K. No, S. Hong, S. Buehlmann, H. Park, D.-K. Min, S.-H. Kim,, Applied Physics Letters, 89 (16), 162907

"Formation and process optimization of scanning resistive probe"

H. Shin*, C. Kim, B. Lee, J. Lee, H. Park, D.-K. Min, J. Jung, S. Hong, S. Kim, Journal of Vacuum Science & Technology B, 24 (5), 2417-2420

"Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications"

Y. Kim*, Y. Cho, K. No, S. Hong, S. Buehlmann, H. Park, D.-K. Min, S.-H. Kim, Applied Physics Letters, 89 (17), 172909

"Grain/domain interaction and its effect on bit formation in ferroelectric films"

Y. Kim*, S. Hong, H. Park, S.-H. Kim, D.-K. Min, K. No, Integrated Ferroelectrics, 78 (1), 255-260

"Surface potential of ferroelectric domains investigated by Kelvin force microscopy"

Y. Kim*, S. Hong, S.-H. Kim, and K. No, Journal of Electroceramics, 17, 185-188

"Surface potential relaxation of ferroelectric domain investigated by Kelvin probe force microscopy"

J. Kim*, Y. Kim, K. No, S. Bühlmann, S. Hong, Y.-W. Nam, S.-H. Kim, Integrated Ferroelectrics, 85 (1), 25-30