"Simulation and Fabrication of Attenuated Phase-Shifting Mask"

E. Kim, S. Hong, Z. -T. Jiang, S. -C. Lim, S. -G. Woo, Y. -B. Koh and K. No, Appl. Opt, 36, 7247-7256

"On measurement of optical band gap of chromium oxide films containing both crystalline and amorphous phases"

S. Hong*, E. Kim, D.-W. Kim, T.-H. Sung and K. No,, Journal of Non-Crystalline Solids, 221, 245-254

"Single-layer halftone phase-shifting masks for DUV microlithography: optical property simulation and chromium compound film preparation"

Z.-T. Jiang*, S. Hong, E. Kim, B.-S. Bae, S. Lim, S.-G. Woo, Y.-B. Koh and K. No, Applied Surface Science, 113-114, 680-684

"Effects of Texturing and Microbridge Length on the IR Responsivity of YBa2Cu3Ox Thin Film"

S. J. Bae, S. Hong, E. Kim, W. Shin, C. H. Cho, Y. K. Kim, Y. S. Bae, T. -H. Sung and K. No, Japanese Journal of Applied Physics, 35, 1716-1719

"A Simulation Model for Thickness Profile of The Film Deposited Using Planar Circular Type Magnetron Sputtering Sources"

S. Hong*, E. Kim, Z. -T. Jiang, B. -S. Bae, S. -C. Lim, S. -G. Woo, Y. -B., Koh and K. No, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 14(5), 2721-2727

"Optical property simulation of single-layer halftone phase shifting masks for DUV microlithography"

Z. -T. Jiang, S. Hong, E. Kim, B. -S. Bae, S. -C. Lim, S. -G. Woo, Y. -B. Koh and K. No, Semiconductor Science and Technology, 11(10), 1450-1455

"Microwave response of YBa2Cu3O7-x grain boundary junction"

C. Cho, J. Shin, D. Hwang, Y. Kim, Y. Lee, K. No, S. Bae, S. Hong and John S. Chun, Journal of Applied Physics, 77, 2193-2195