"Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy"

J. Woo, S. Hong*, N. Setter, H. Shin, J. U. Jeon, Y. E. Pak and K. No, Journal of Vacuum Science & Technology B, 19, 818-824

"Stability and Read/Write Characteristics of Nano Ferroelectric Domains"

K. No, H. W. Song, J. Hong, J. Woo, H. Shin, S. Hong, Ferroelectrics, 259, 289-298

"Piezoelectric hysteresis measurement using atomic force microscopy"

H. Shin, J. K. Shin, S. Hong, J.-U. Jeon, H. W. Song, J. Hong, K. No, Integrated Ferroelectrics, 38, 31-38

"Formation of Ferroelectric Nano-Domains using Scanning Force Microscopy for the Future Application of Memory Devices"

H. Shin, J. Woo, S. Hong, J. U. Jeon, Y. E. Pak and K. No, Integrated Ferroelectrics, 31, 163-171

"Effect of metal-insulator-semiconductor structure derived space charge field on the tip vibration signal in electrostatic force microscopy"

S. Hong*, J. Woo, H. Shin, E. Kim, K.-H. Kim, J.-U. Jeon, Y. E. Pak and K. No, Journal of Vacuum Science & Technology B, 18, 2688-2691

"Polaron conduction loss in microwave dielectric ceramics"

S. Hong, E. Kim, H. W. Song, J. Choi, D.-W. Kim, K. No, T.-H. Kim, J.-R. Park, J.-W. Han, Journal of Materials Research, 14, 500-502

"Observation of domain nucleation and growth during switching process"

S. Hong, E. L. Colla, E. Kim, K. No, A. K. Tagantsev, P. Muralt, and N. Setter, Ferroelectrics, 223, 143-148

"Effects of Etching Time and Thickness on the Performance of The Microstrip Line Resonator of YBa2Cu3Ox Thin Films"

W. Choi, S. Hong, B.-H. Jun, T.-H. Sung, Y. Park, and K. No, Japanese Journal of Applied Physics, 38, 1941

"High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O3 ferroelectric thin film capacitors"

S. Hong*, E. L. Colla, E. Kim, D. V. Taylor, A. K. Tagantsev, P. Muralt, K. No, Journal of Applied Physics, 86, 607-613

"Water-induced degradation of chromium fluoride films"

E. Kim*, S. Hong, J. D. Gorman, S. Lim, S.-Y. Moon, D.-W. Kim and K. No, Thin Solid Films, 324, 292-299

"Direct observation of region by region suppression of the switchable polarisation (fatigue) in Pb(Zr,Ti)O3 thin films capacitors with Pt-electrodes"

E. L. Colla*, S. Hong, D. V. Taylor, A. K. Tagantsev, K. No and N. Setter, Applied Physics Letters, 72, 2763-2765

"Attenuated phase-shifting masks of chromium aluminum oxide"

E. Kim, S. Hong, S. Lim, Y.-B. Kim, D.-W. Kim and K. No, Applied Optics, 37, 4254-4259

"Microscopic observation of ‘region by region’ polarisation domains freezing during fatigue of the Pt-PZT-Pt system"

E. L. Colla, D. V. Taylor, S. Hong, A. K. Tagantsev, K. No, Integrated Ferroelectrics, 22, 237-244

"Effects of Gas Ring Position and Mesh Introduction on Film Quality and Thickness Uniformity"

S. Hong*, E. Kim, Z. -T. Jiang, B. -S. Bae, S. -C. Lim, S. -G. Woo, Y. -B. Koh and K. No, Materials Science and Engineering: B, 45, 98-101

"Simulation and Fabrication of Attenuated Phase-Shifting Mask"

E. Kim, S. Hong, Z. -T. Jiang, S. -C. Lim, S. -G. Woo, Y. -B. Koh and K. No, Appl. Opt, 36, 7247-7256