"Read/Write Mechanisms and Data Storage System using Atomic Force Microscopy and MEMS Technology"

H. Shin*, S. Hong, J. Moon, and J. U. Jeon, Ultramicroscopy, 91, 103-110

"Effect of domain structure on thermal stability of nanoscale ferroelectric domains"

J. Woo, S. Hong*, D. K. Min, H. Shin, K. No, Applied Physics Letters, 80, 4000-4002

"Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O3 film capacitors"

I. Stolichnov*, E. Colla, A. Tagantsev, S. Bharadwaja, S. Hong, Applied Physics Letters, 80, 4804-4806

"Study of domain stability on (Pb0.76Ca0.24)TiO3 thin films using piezoresponse microscopy"

H. Y. Guo, J. B. Xu*, I. H. Wilson, Z. Xie, E. Z. Luo, S. Hong, Applied Physics Letters, 81, 715-717

"Fabrication and Characterization of Pb(Zr,Ti)O3 (PZT) Ultra-Thin Films Below 100 nm"

J. Hong, H. W. Song, S. Hong, H. Shin, K. No, Ferroelectrics, 271, 57-62

"Evidence for Forward Domain Growth being Rate Limiting Step in Polarization Switching in <111>-oriented-Pb(Zr0.45Ti0.55)O3 Thin Film Capacitors"

S. Hong*, N. Setter, Applied Physics Letters, 81, 3437-3439

"Fabrication and Investigation of Ultra-Thin and Smooth Pb(Zr,Ti)O3 Films for Miniaturization of Microelectronics Devices"

J. Hong*, H. W. Song, S. Hong, H. Shin, K. No, Journal of Applied Physics, 92, 7434-7441

"Principle of Ferroelectric Domain Imaging using Atomic Force Microscope"

S. Hong*, J. Woo, H. Shin, J.-U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim and K. No, Journal of Applied Physics, 89, 1377-1386

"Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy"

J. Woo, S. Hong*, N. Setter, H. Shin, J. U. Jeon, Y. E. Pak and K. No, Journal of Vacuum Science & Technology B, 19, 818-824

"Stability and Read/Write Characteristics of Nano Ferroelectric Domains"

K. No, H. W. Song, J. Hong, J. Woo, H. Shin, S. Hong, Ferroelectrics, 259, 289-298

"Piezoelectric hysteresis measurement using atomic force microscopy"

H. Shin, J. K. Shin, S. Hong, J.-U. Jeon, H. W. Song, J. Hong, K. No, Integrated Ferroelectrics, 38, 31-38

"Formation of Ferroelectric Nano-Domains using Scanning Force Microscopy for the Future Application of Memory Devices"

H. Shin, J. Woo, S. Hong, J. U. Jeon, Y. E. Pak and K. No, Integrated Ferroelectrics, 31, 163-171

"Effect of metal-insulator-semiconductor structure derived space charge field on the tip vibration signal in electrostatic force microscopy"

S. Hong*, J. Woo, H. Shin, E. Kim, K.-H. Kim, J.-U. Jeon, Y. E. Pak and K. No, Journal of Vacuum Science & Technology B, 18, 2688-2691

"Polaron conduction loss in microwave dielectric ceramics"

S. Hong, E. Kim, H. W. Song, J. Choi, D.-W. Kim, K. No, T.-H. Kim, J.-R. Park, J.-W. Han, Journal of Materials Research, 14, 500-502

"Observation of domain nucleation and growth during switching process"

S. Hong, E. L. Colla, E. Kim, K. No, A. K. Tagantsev, P. Muralt, and N. Setter, Ferroelectrics, 223, 143-148