"Nanoscale Piezoresponse Studies of Ferroelectric Domains in Epitaxial BiFeO3 nanostructures"

S. Hong*, J. A. Klug, M. Park, A. Imre, M. J. Bedzyk, K. No, A. Petford-Long, O. Auciello,, Journal of Applied Physics, 105 (6), 061619

"Coexistence of Weak Ferromagnetism and Ferroelectricity in the High Pressure LiNbO3-type Phase of FeTiO3"

T. Varga, A. Kumar, E. Vlahos, S. Denev, M. Park, S. Hong, T. Sanehira, Y. Wang, C. J. Fennie, S. K. Streiffer, X. Ke, P. Schiffer, V. Gopalan, J. F. Mitchell, Physical Review Letters, 103 (4), 047601

"Screen charge transfer by grounded tip on ferroelectric surfaces"

Y. Kim*, J. Kim, S. Bühlmann, S. Hong, Y. K. Kim, S.-H. Kim and K. No, Physica Status Solidi - Rapid Research Letter, 2 (2), 74-76

"Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling"

J. H. Yoo*, J.-M. Yang, S. Ulugbek, C. W. Ahn, W.-J. Hwang, J. K. Park, C. M. Park, S. Hong, J. J. Kim, and D. Shindo, Journal of Electron Microscopy, 57 (1), 13-18

"Characterization of Sensitivity and Resolution of Silicon Resistive Probe"

J. Kim, J. Lee, I. Song, J. D. Lee, B.-G. Park, S. Hong, H. Ko, D.-K. Min, H. Park, C. Park, J. Jung, and H. Shin*, Japanese Journal of Applied Physics, 47, 1717

"Modeling and Simulation of a Resistive Thermal Probe"

D. K. Min*, S. Hong*, IEEE Sensors, 320-324

"Injection charge assisted polarization reversal in ferroelectric thin films"

Y. Kim*, S. Bühlmann, S. Hong, S.-H. Kim, and K. No, Applied Physics Letters, 90 (7), 072910

"Nano-tribological characteristics of PZT thin film investigated by atomic force microscopy"

K.-H. Chung, Y.-H. Lee, Y.-T. Kim, D.-E. Kim*, J. Yoo and S. Hong, Surface and Coatings Technology, 201 (18), 7983-7991

"Local surface potential distribution in oriented ferroelectric thin films"

Y. Kim*, S. Bühlmann, J. Kim, M. Park, K. No, Y. K. Kim, and S. Hong, Applied Physics Letters, 91 (5), 052906

"Design and Analysis of the Position Detection Algorithm for a Probe Storage"

D. K. Min*, S. Hong*, IEEE Sensors Journal, 6 (4), 1010-1015

"Ferroelectric Thin Films: Review of Materials, Properties and Applications"

N. Setter*, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, H. Kohlstedt, A. Kingon, N. Y. Park, G. B. Stephenson, I. Stolitchnov, A. K. Tagantsev, D. V. Taylor, T. Yamada, S. Streiffer, Journal of Applied Physics, 100 (5), 051606

"Correlation between grain size and domain size distribution in ferroelectric media for probe storage applications"

Y. Kim*, Y. Cho, K. No, S. Hong, S. Buehlmann, H. Park, D.-K. Min, S.-H. Kim,, Applied Physics Letters, 89 (16), 162907

"Formation and process optimization of scanning resistive probe"

H. Shin*, C. Kim, B. Lee, J. Lee, H. Park, D.-K. Min, J. Jung, S. Hong, S. Kim, Journal of Vacuum Science & Technology B, 24 (5), 2417-2420

"Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications"

Y. Kim*, Y. Cho, K. No, S. Hong, S. Buehlmann, H. Park, D.-K. Min, S.-H. Kim, Applied Physics Letters, 89 (17), 172909

"Grain/domain interaction and its effect on bit formation in ferroelectric films"

Y. Kim*, S. Hong, H. Park, S.-H. Kim, D.-K. Min, K. No, Integrated Ferroelectrics, 78 (1), 255-260