■ Title: Exploring Ionic transport using atomic force microscopy                    
■ Speaker: 김윤석 교수 ( Prof. Yunseok Kim, School of Advanced Materials Science and Engineering, Sungkyunkwan University) 

■ Host: Dr. Seungbum Hong, Materials Science Department (T. 3324)
■ Date: Wednesday, June 21st, 2017 14:00 
■ Location: Applied Engineering Building (W1-1) Rm. 2427, 2nd floor

■ Abstract:  Ionic phenomena underpin a broad spectrum of energy, chemical, and information technologies such as batteries, fuel cells, and electroresistive information devices. The optimization of functionalities in these devices requires fundamental understanding of ionic transport at the nanoscale. Although the ionic phenomena have been extensively studied using macroscopic electrical measurements, these macroscopic tools are limited for exploring nanoscale transport phenomena. Furthermore, even though electron microscopies allow exploring nanoscale ionic transport, these methods are limited for analyzing dynamic behavior. Here, I will summarize our recent efforts to explore nanoscale ionic transport using atomic force microscopy (AFM) such as electrochemical strain microscopy and current atomic force microscopy. This allows us to explore ionic phenomena and as well as the interplay between ionic and electronic transport at the nanoscale. Furthermore, in addition to the typical ionic dynamics driven by electric field, I will present ionic transport driven by mechanical force, i.e. piezochemical effect. The present work suggests new strategies to explore local ionic transport using AFM and provides fundamental information on the control of the local ionic transport.