Method of Fabricating Resistive Probe Having Self-aligned Metal Shield Inventor H. Park, J. Jung, H. Ko, S. Hong Code 1 US 7,605,014 (2009)(issued) Code 2 JP 4101848 (2008)(issued) Code 3 KR 0723410 (2007)(issued) 목록 이전글Semiconductor Probe Having Resistive Tip with Low Aspect Ratio and Method of Fabricating the Same 17.03.24 다음글Semiconductor Probe with High Resolution Resistive Tip and Method of Fabricating the Same 17.03.24