Method of Fabricating Semiconductor Probe with Resistive Tip

Inventor

H. Park, J. Jung, S. Hong

Code 1

WO04/090971 (2004) (filed)

Code 2

US 7,338,831 (2008)(issued)

Code 3

JP 4217218 (2008)(issued)

Code 4

EP 1,611,607 (2006)(issued)

Code 5

CN 100356542 (2007), KR 0537508 (2005)(issued), AU 2003282399 (2004)(issued)