Method of manufacturing semiconductor probe having resistive tip Inventor C. M. Park, H. S. Park, H. Ko, S. Hong Code 1 US 7,419,843 (2008) (issued) Code 2 JP 4050291(2007)(issued) Code 3 CN 1755839 (2006)(filed) Code 4 KR 0580652 (2006)(issued) 목록 이전글Probe Position Error Detecting Method and Apparatus in Probe-Based Data Storage System 17.03.24 다음글Semiconductor probe with resistive tip and method of fabricating the same 17.03.24