Semiconductor probe with resistive tip and method of fabricating the same

Inventor

H. S. Park, K. L. Baeck, C. M. Park, S. Hong, H. S. Koh, J. H. Jung

Code 1

US 7,319,224 (2008)(issued)

Code 2

JP 4216836 (2008)(issued)

Code 3

EP 1,632,954 (2007)(issued)

Code 4

DE 20050003279 (2008)(issued)

Code 5

CN 1747071 (2006)(filed), KR 0624434 (2006)(issued)