Semiconductor probe with resistive tip having metal shield thereon

Inventor

J. Jung, H. Ko, S. Hong, H. C. Shin

Code 1

US 7,411,210 (2008)(issued)

Code 2

JP 4369430B2 (2009)(issued)

Code 3

EP 1,681,548 (2007)(issued)

Code 4

DE 20060000055 (2008)(issued)

Code 5

CN 1811944B (2012)(issued), KR 0682916 (2007)(issued)