Semiconductor Probe Having Resistive Tip with Low Aspect Ratio and Method of Fabricating the Same Inventor H. Ko, J. Jung, S. Hong, H. Park Code 1 US 7,528,371 (2009)(issued) Code 2 JP 4101847 (2008)(issued) Code 3 KR 0707204 (2007)(issued) 목록 이전글Ferroelectric Information Storage Device and Method of Writing/Reading Information 17.03.24 다음글Method of Fabricating Resistive Probe Having Self-aligned Metal Shield 17.03.24