Effect of stress state on the domain configuration and switching behavior in ferroelectric thin films

Author

M. Narayanan*, M. Pan, S. Liu, S. Tong, S. Hong*, B. Ma, and U. Balachandran

Journal

RSC Advances

Vol

2 (31)

Page

11901-11907

Year

2012

Link

https://doi.org/10.1039/c2ra20678a 528회 연결