Effect of stress state on the domain configuration and switching behavior in ferroelectric thin films Author M. Narayanan*, M. Pan, S. Liu, S. Tong, S. Hong*, B. Ma, and U. Balachandran Journal RSC Advances Vol 2 (31) Page 11901-11907 Year 2012 Link https://doi.org/10.1039/c2ra20678a 574회 연결 목록 이전글Visualization of Magnetic Domain Structure Changes Induced by Interfacial Strain in CoFe2O4/BaTiO3 Heterostructures 18.06.07 다음글Magnetic interactions and reversal of artificial square spin ices 18.08.03