Effects of Texturing and Microbridge Length on the IR Responsivity of YBa2Cu3Ox Thin Film Author S. J. Bae, S. Hong, E. Kim, W. Shin, C. H. Cho, Y. K. Kim, Y. S. Bae, T. -H. Sung and K. No Journal Japanese Journal of Applied Physics Vol 35 Page 1716-1719 Year 1996 Link https://doi.org/10.1143/JJAP.35.1716 792회 연결 목록 이전글A Simulation Model for Thickness Profile of The Film Deposited Using Planar Circular Type Magnetron Sputtering Sources 24.05.16 다음글Microwave response of YBa2Cu3O7-x grain boundary junction 24.06.21