High-Resolution Field Effect Sensing of Ferroelectric Charges Author H. Ko, K. Ryu, H. Park, C. Park, Y. K. Kim, J. Jung, D. -K. Min, Y. Kim, H. Shin, S. Hong* Journal Nano Letters Vol 11 (4) Page 1428-1433 Year 2011 Link https://doi.org/10.1021/nl103372a 742회 연결 검색 목록 이전글Nanoscale bit formation in highly (111)-oriented ferroelectric thin films deposited on glass substrates for high-density storage media 20.03.12 다음글Observation of mechanical fracture and corresponding domain structure changes of polycrystalline PbTiO3 nanotubes 20.03.12