Memory effect of a single-walled carbon nanotube on nitride-oxide structure under various bias conditions Author H. Park, H. Shin, J. H. Kim, S. Hong, J. Xu Journal Applied Physics Letters Vol 96 (2) Page 023101 Year 2010 Link https://doi.org/10.1063/1.3291054 872회 연결 검색 목록 이전글Effect of deposition temperature on surface morphology and magnetic properties in epitaxial CoFe2O4 thin films deposited by metal organic chemical vapor depositon 20.03.12 다음글Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films 20.03.12