Piezoresponse force microscopy studies of PbTiO3 thin films grown via layer-by-layer gas phase reaction Author M. Park, S. Hong*, J. Kim, Y. Kim, S. Bühlmann, Y. K. Kim, K. No Journal Applied Physics Letters Vol 94 (9) Page 092901 Year 2009 Link https://doi.org/10.1063/1.3081120 507회 연결 목록 이전글Effects of Self-Assembled Monolayer and PFPE Lubricant on the Wear Characteristics of Flat Silicon Tips 20.05.13 다음글Origin of surface potential change during ferroelectric switching in epitaxial PbTiO3 thin films studied by scanning force microscopy 20.06.14