Characterization of Sensitivity and Resolution of Silicon Resistive Probe Author J. Kim, J. Lee, I. Song, J. D. Lee, B.-G. Park, S. Hong, H. Ko, D.-K. Min, H. Park, C. Park, J. Jung, and H. Shin* Journal Japanese Journal of Applied Physics Vol 47 Page 1717 Year 2008 Link https://doi.org/10.1143/JJAP.47.1717 586회 연결 목록 이전글Origin of surface potential change during ferroelectric switching in epitaxial PbTiO3 thin films studied by scanning force microscopy 20.06.14 다음글Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling 20.10.12