Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications

Author

Y. Kim*, Y. Cho, K. No, S. Hong, S. Buehlmann, H. Park, D.-K. Min, S.-H. Kim

Journal

Applied Physics Letters

Vol

89 (17)

Page

172909

Year

2006

Link

https://doi.org/10.1063/1.2370502 686회 연결