Formation and process optimization of scanning resistive probe Author H. Shin*, C. Kim, B. Lee, J. Lee, H. Park, D.-K. Min, J. Jung, S. Hong, S. Kim Journal Journal of Vacuum Science & Technology B Vol 24 (5) Page 2417-2420 Year 2006 Link https://doi.org/10.1116/1.2354163 791회 연결 검색 목록 이전글Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications 21.03.03 다음글Correlation between grain size and domain size distribution in ferroelectric media for probe storage applications 21.03.04