Fabrication and Characterization of Pb(Zr,Ti)O3 (PZT) Ultra-Thin Films Below 100 nm Author J. Hong, H. W. Song, S. Hong, H. Shin, K. No Journal Ferroelectrics Vol 271 Page 57-62 Year 2002 Link https://doi.org/10.1080/713716186 531회 연결 검색 목록 이전글Evidence for Forward Domain Growth being Rate Limiting Step in Polarization Switching in <111>-oriented-Pb(Zr0.45Ti0.55)O3 Thin Film Capacitors 23.03.01 다음글Study of domain stability on (Pb0.76Ca0.24)TiO3 thin films using piezoresponse microscopy 23.03.01