Stability and Read/Write Characteristics of Nano Ferroelectric Domains Author K. No, H. W. Song, J. Hong, J. Woo, H. Shin, S. Hong Journal Ferroelectrics Vol 259 Page 289-298 Year 2001 Link https://doi.org/10.1080/00150190108008750 720회 연결 검색 목록 이전글Piezoelectric hysteresis measurement using atomic force microscopy 23.03.01 다음글Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy 23.06.07