Principle of Ferroelectric Domain Imaging using Atomic Force Microscope Author S. Hong*, J. Woo, H. Shin, J.-U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim and K. No Journal Journal of Applied Physics Vol 89 Page 1377-1386 Year 2001 Link https://doi.org/10.1063/1.1331654 674회 연결 검색 목록 이전글Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy 23.06.07