Channel Thickness-Dependent Degradation of Field-Effect Mobility in Multilayer MoS2 Transistors

Author

Dae-Young Jeon*, Soyun Joo, Dahyun Lee, Seungbum Hong*

Journal

ACS Applied Electronic Materials

Vol

6 (1)

Page

465-471

Year

2023

Link

https://doi.org/10.1021/acsaelm.3c01461 1116회 연결