Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy
Author
H. Liu, Y. Dong, M. J. Cherukara, K. Sasikumar, B. Narayanan, Z. Cai, B. Lai, L. Stan, S. Hong, M. K. Y. Chan, S. K. R. S. Sankaranarayanan, H. Zhou*, D. D. Fong*