Screening Mechanisms at Polar Oxide Heterointerfaces Author S. Hong*, S. M. Nakhmanson*, and D. D. Fong* Journal Reports on Progress in Physics Vol 79 (7) Page 076501 Year 2016 Link https://doi.org/10.1088/0034-4885/79/7/076501 678회 연결 검색 목록 이전글Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy 17.03.24 다음글Imaging Ferroelectric Domains and Domain Walls Using Charge Gradient Microscopy: Role of Screening Charges 17.03.24