Publication

Materials Imaging & Integration

Journals

Optical property simulation of single-layer halftone phase shifting masks for DUV microlithography
Author
Z. -T. Jiang, S. Hong, E. Kim, B. -S. Bae, S. -C. Lim, S. -G. Woo, Y. -B. Koh and K. No
Journal
Semiconductor Science and Technology
Vol
11(10)
Page
1450-1455
Year
1996