"Tribological Characteristics of Probe Tip and PZT media for AFM-Based Recording Technology"

K.-H. Chung, Y.-H. Lee, D.-E. Kim*, J. Yoo, and S. Hong, IEEE Transactions on Magnetics, 41 (2), 849-854

"Servo and Tracking Algorithm For a Probe Storage System"

D. K. Min*, S. Hong*, IEEE Transactions on Magnetics, 41 (2), 855-859

"Quartz Crystal Resonator Based Scanning Probe Microscopy"

Y. Seo*, S. Hong, Modern Physics Letters B, 19 (26), 1303-1322

"Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)"

H. Shin*, B. Lee, C. Kim, H. Park, D.-K. Min, J. Jung, S. Hong, and S. Kim, Electronic Materials Letters, 1 (2), 127-133