"Effect of Cantilever-Sample interaction on Piezoelectric Force Microscopy"

S. Hong*, H. Shin, J. Woo, K. No, Applied Physics Letters, 80, 1453-1455

"Read/Write Mechanisms and Data Storage System using Atomic Force Microscopy and MEMS Technology"

H. Shin*, S. Hong, J. Moon, and J. U. Jeon, Ultramicroscopy, 91, 103-110

"Effect of domain structure on thermal stability of nanoscale ferroelectric domains"

J. Woo, S. Hong*, D. K. Min, H. Shin, K. No, Applied Physics Letters, 80, 4000-4002

"Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O3 film capacitors"

I. Stolichnov*, E. Colla, A. Tagantsev, S. Bharadwaja, S. Hong, Applied Physics Letters, 80, 4804-4806

"Study of domain stability on (Pb0.76Ca0.24)TiO3 thin films using piezoresponse microscopy"

H. Y. Guo, J. B. Xu*, I. H. Wilson, Z. Xie, E. Z. Luo, S. Hong, Applied Physics Letters, 81, 715-717

"Fabrication and Characterization of Pb(Zr,Ti)O3 (PZT) Ultra-Thin Films Below 100 nm"

J. Hong, H. W. Song, S. Hong, H. Shin, K. No, Ferroelectrics, 271, 57-62

"Evidence for Forward Domain Growth being Rate Limiting Step in Polarization Switching in <111>-oriented-Pb(Zr0.45Ti0.55)O3 Thin Film Capacitors"

S. Hong*, N. Setter, Applied Physics Letters, 81, 3437-3439

"Fabrication and Investigation of Ultra-Thin and Smooth Pb(Zr,Ti)O3 Films for Miniaturization of Microelectronics Devices"

J. Hong*, H. W. Song, S. Hong, H. Shin, K. No, Journal of Applied Physics, 92, 7434-7441