"Principle of Ferroelectric Domain Imaging using Atomic Force Microscope"

S. Hong*, J. Woo, H. Shin, J.-U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim and K. No, Journal of Applied Physics, 89, 1377-1386

"Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy"

J. Woo, S. Hong*, N. Setter, H. Shin, J. U. Jeon, Y. E. Pak and K. No, Journal of Vacuum Science & Technology B, 19, 818-824

"Stability and Read/Write Characteristics of Nano Ferroelectric Domains"

K. No, H. W. Song, J. Hong, J. Woo, H. Shin, S. Hong, Ferroelectrics, 259, 289-298

"Piezoelectric hysteresis measurement using atomic force microscopy"

H. Shin, J. K. Shin, S. Hong, J.-U. Jeon, H. W. Song, J. Hong, K. No, Integrated Ferroelectrics, 38, 31-38