Principle of Ferroelectric Domain Imaging using Atomic Force Microscope Division 6Selected Publications Link https://doi.org/10.1063/1.1331654 873회 연결 Principle of Ferroelectric Domain Imaging using Atomic Force Microscope, S. Hong*, J. Woo, H. Shin, J.-U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim and K. No, J. Appl. Phys. 89, 1377-1386 (2001) 목록 이전글High Resolution Field Effect Sensing of Ferroelectric Charges 18.08.14 다음글Flexible piezoelectric and ferroelectric haloimidazole crystals 23.09.03
